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DeCS
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Descriptor English:
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Electron Probe Microanalysis
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Descriptor Spanish:
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Microanálisis por Sonda Electrónica
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Descriptor Portuguese:
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Microanálise por Sonda Eletrônica
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Synonyms English:
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Microscopy, Electron, X-Ray Microanalysis
Spectrometry, X-Ray Emission, Electron Microscopic
Spectrometry, X-Ray Emission, Electron Probe
X-Ray Emission Spectrometry, Electron Microscopic
X-Ray Emission Spectrometry, Electron Probe
X-Ray Microanalysis, Electron Microscopic
X-Ray Microanalysis, Electron Probe
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Tree Number:
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E01.370.350.515.402.250
E05.196.867.800.360
E05.595.402.250
E05.799.830.360
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Definition English:
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Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode. |
Indexing Annotation English:
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DF: ELECTRON PROBE MICROANAL
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See Related English:
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Nuclear Microscopy
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History Note English:
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70(67)
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Allowable Qualifiers English:
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Record Number:
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4649
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Unique Identifier:
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D004577
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Occurrence in VHL:
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Similar:
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DeCS CID-10 SciELO LILACS LIS
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